The TIBML is equipped with a 3MV tandem accelerator, two ion sources, three beamlines, and four endstations that provide state-of-the-art capabilities for ion beam analysis, materials modification, fundamental research on ion-solid interactions, and applied research on radiation effects in materials for nuclear and space applications
Ion Beam Analysis
Ion beam analysis (IBA) can be used to obtain elemental and isotopic composition profiles in the near-surface layer of materials. IBA methods can achieve elemental resolution in the parts per million range, and depth resolution is typically on the order of a few nanometers over depths to a few micrometers. IBA capabilities and service include:
- Rutherford and non-Rutherford backscattering spectrometry
- Ion channeling
- Nuclear reaction analysis
- Elastic recoil detection analysis
Ion Irradiation
Ion irradiation can be used to conduct fundamental and applied research on the interaction of energetic ions with solids and subsequent effects on the structure and properties of the irradiated materials.
Ion implantation
Ion implantation involves irradiating materials with one or more ions of specific elemental or isotopic type to introduce specific electronic dopants, isotopes or chemical changes into materials to tailor or modify properties. Ion beam irradiation and implantation capabilities and service include:
- Ions of most elements, except rare gases, from hydrogen to gold
- Energies from 500 keV up to about 30 MeV, depending on ion and current needed
- Controlled irradiation temperatures from 30 to 1475 K
TEM – JEOL 2100+
The JEM-2100 Plus is a multipurpose 200kV LaB6 TEM that provides solutions for a wide range of applications from materials science to medical/biological studies. It is expected to come online Winter 2023.